C.P.D. MEASUREMENTS ON OXIDIZED SILICON SURFACESSULI A; MICHAILOVITS L.1972; ACTA PHYS. CHEM.; HONGR.; DA. 1972; VOL. 18; NO 1-2; PP. 27-37; ABS. RUSSE; BIBL. 9 REF.Serial Issue

PREPARATION OF AMORPHOUS V₂O₅ THIN FILMS BY CHEMICAL VAPOR DEPOSITION METHODBALI K; MICHAILOVITS L; HEVESI I et al.1979; ACTA PHYS. CHEM.; HUN; DA. 1979; VOL. 25; NO 1-2; PP. 43-45; ABS. RUS; BIBL. 7 REF.Article

DETERMINATION OF THE THICKNESS AND THE REFRACTIVE INDEX OF V₂O₅ THIN FILMS FROM REFLECTANCE INTERFERENCE SPECTRASULI A; MICHAILOVITS L; HEVESI I et al.1979; ACTA PHYS. CHEM.; HUN; DA. 1979; VOL. 25; NO 1-2; PP. 29-41; ABS. RUS; BIBL. 8 REF.Article

ETCHING INVESTIGATIONS ON SINGLE CRYSTALS OF V₂O₅.BALI K; MICHAILOVITS L; HEVESI I et al.1977; ACTA PHYS. CHEM.; HONGR.; DA. 1977; VOL. 23; NO 2-3; PP. 279-286; ABS. RUSSE; BIBL. 12 REF.Article

PREPARATION AND INVESTIGATION OF THICK SI(LI) P-I-N GAMMA DETECTORS.SULI A; MICHAILOVITS L; LISZT F et al.1974; ACTA PHYS. CHEM.; HONGR.; DA. 1974; VOL. 20; NO 3; PP. 333-350; ABS. RUSSE; BIBL. 14 REF.Article

PHOTOCONDUCTIVITY OF V₂O₅-SI SANDWICH SYSTEM.SULI A; KURMASHEV SD; MICHAILOVITS L et al.1976; ACTA PHYS. CHEM.; HONGR.; DA. 1976; VOL. 22; NO 1-4; PP. 45-55; ABS. RUSSE; BIBL. 8 REF.Article

Extended fringe pattern method for the analysis of the absorption coefficientMICHAILOVITS, L; TOROK, M. I; HEVESI, I et al.Thin solid films. 1986, Vol 139, Num 2, pp 143-146, issn 0040-6090Article

Extended fringe pattern method for the analysis of the absorption coefficientMICHAILOVITS, L; TOROK, M. I; HEVESI, I et al.Thin solid films. 1986, Vol 139, Num 2, pp 143-146, issn 0040-6090Article

Damage of V₂O₅ single crystals by powerful pulsed CO₂ laser irradiationNANAI, L; HEVESI, I; MICHAILOVITS, L et al.Physica status solidi. A. Applied research. 1983, Vol 77, Num 2, pp 679-684, issn 0031-8965Article